In this paper we present a study of the effects of parasitic elements of interconnection lines in integrated circuits (I.C.) where Carbon NanoTubes (CNTs) are embedded. In particular the Drain/Source pads dimensions of CNT are analyzed, as well as the interconnection lines between a CNT and an appropriate load are sized.Furthermore the time domain and frequency simulations of some circuits are presented in order to see how the parasitic elements could limit the high-speed performances of CNTs.
Effects of Parasitic Elements of Interconnection Lines in CNT Embedded Integrated Circuits / Marani, Roberto; Perri, Anna Gina. - In: ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. - ISSN 2162-8769. - STAMPA. - 9:2(2020). [10.1149/2162-8777/ab69b2]
Effects of Parasitic Elements of Interconnection Lines in CNT Embedded Integrated Circuits
Roberto MARANISoftware
;Anna Gina PERRIMethodology
2020-01-01
Abstract
In this paper we present a study of the effects of parasitic elements of interconnection lines in integrated circuits (I.C.) where Carbon NanoTubes (CNTs) are embedded. In particular the Drain/Source pads dimensions of CNT are analyzed, as well as the interconnection lines between a CNT and an appropriate load are sized.Furthermore the time domain and frequency simulations of some circuits are presented in order to see how the parasitic elements could limit the high-speed performances of CNTs.| File | Dimensione | Formato | |
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