A fast method to test analogue circuits, featuring low testing cost is proposed here. The method is based on the properties of a set of parameters, αi, easily measured by sampling in a few time points the circuit response to a rectangular pulse. Starting from the specifications defined on the circuit performances, it is possible to identify, via a statistical approach, the acceptability domain in the αi space. The faulty circuit is identified as its αi parameters do not belong to the acceptability region. The method was successfully applied to a second order low pass filter and to a CMOS load compensated Operational Transconductance Amplifier (OTA)
An Approach to the Specification Driven Testing of Analogue Circuits / De Venuto, Daniela; Cantatore, Eugenio; Gramegna, Giuseppe; Marzocca, Cristoforo; Corsi, Francesco. - STAMPA. - (1996), pp. 1283-1286. (Intervento presentato al convegno 8th Mediterranean Electrotechnical Conference on Industrial Applications in Power Systems, Computer Science and Telecommunications, Melecon 96 tenutosi a Bari, Italy nel May 13 - 16, 1996) [10.1109/MELCON.1996.551180].
An Approach to the Specification Driven Testing of Analogue Circuits
De Venuto, Daniela;Marzocca, Cristoforo;Corsi, Francesco
1996-01-01
Abstract
A fast method to test analogue circuits, featuring low testing cost is proposed here. The method is based on the properties of a set of parameters, αi, easily measured by sampling in a few time points the circuit response to a rectangular pulse. Starting from the specifications defined on the circuit performances, it is possible to identify, via a statistical approach, the acceptability domain in the αi space. The faulty circuit is identified as its αi parameters do not belong to the acceptability region. The method was successfully applied to a second order low pass filter and to a CMOS load compensated Operational Transconductance Amplifier (OTA)I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
