In this paper, we present a fast fabrication of Al/Si nanopillars for an ultrasensitive SERS detection of chemical molecules. The fabrication process is only composed of two steps: use of a native oxide layer as a physical etch mask followed by evaporation of an aluminum layer. A random arrangement of well-defined Al/Si nanopillars is obtained on a large-area wafer of Si. A good uniformity of SERS signal is achieved on the whole wafer. Finally, we investigated experimentally the sensitivity of these Al/Si nanopillars for SERS sensing, and analytical enhancement factors in the range of 1.5 × 107 - 2.5 × 107 were found for the detection of thiophenol molecules. Additionally, 3D FDTD simulations were used to better understand optical properties of Al/Si nanopillars as well as the Raman enhancement.

Al/Si nanopillars as very sensitive SERS substrates / Magno, Giovanni; Bélier, Benoit; Barbillon, Grégory. - In: MATERIALS. - ISSN 1996-1944. - ELETTRONICO. - 11:9(2018). [10.3390/ma11091534]

Al/Si nanopillars as very sensitive SERS substrates

Giovanni Magno;
2018-01-01

Abstract

In this paper, we present a fast fabrication of Al/Si nanopillars for an ultrasensitive SERS detection of chemical molecules. The fabrication process is only composed of two steps: use of a native oxide layer as a physical etch mask followed by evaporation of an aluminum layer. A random arrangement of well-defined Al/Si nanopillars is obtained on a large-area wafer of Si. A good uniformity of SERS signal is achieved on the whole wafer. Finally, we investigated experimentally the sensitivity of these Al/Si nanopillars for SERS sensing, and analytical enhancement factors in the range of 1.5 × 107 - 2.5 × 107 were found for the detection of thiophenol molecules. Additionally, 3D FDTD simulations were used to better understand optical properties of Al/Si nanopillars as well as the Raman enhancement.
2018
Al/Si nanopillars as very sensitive SERS substrates / Magno, Giovanni; Bélier, Benoit; Barbillon, Grégory. - In: MATERIALS. - ISSN 1996-1944. - ELETTRONICO. - 11:9(2018). [10.3390/ma11091534]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/223246
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