On sensitivity analysis based optimization of the production yields for MMIC space applications

The techniques used for the design of circuits for space applications are not different from those used for commercial applications. However the technology and the fabrication processes must be oriented to obtain an average life of the circuit and/or component higher than the expected service offered from the satellite. For these applications the Monolithic Microwave Integrated Circuit (MMIC) design techniques must satisfy requirements that include also specifications such as the reliability and the final production yield. In this paper a MMIC design technique, oriented to the optimization of the production yields, is proposed. This method, based on a sensitivity analysis, i.e. on the circuit behavior for value variations of passive elements from their nominal value, and on the contemporary determination of the production yields, allows the identification the circuit elements to obtain high production yield. Moreover it allows an appropriate choice of the circuit topology. As example, this technique has been applied to design a MMIC to employ on a Synthetic Aperture Radar (SAR) in X band.