In this paper we present a de-embedding procedure in order to determine the equivalent circuit parameters of CNTFETs for RF applications. This proposed technique allows to remove random errors in measured S parameters of small-signal device: in this way the intrinsic model of CNTFETs can be implement directly in simulation software.
A De-Embedding Procedure to Determine the Equivalent Circuit Parameters of RF CNTFETs / Marani, Roberto; Perri, Anna Gina. - In: ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. - ISSN 2162-8769. - STAMPA. - 5:5(2016), pp. 31-34. [10.1149/2.0121605jss]
A De-Embedding Procedure to Determine the Equivalent Circuit Parameters of RF CNTFETs
MARANI, ROBERTO;PERRI, Anna Gina
2016-01-01
Abstract
In this paper we present a de-embedding procedure in order to determine the equivalent circuit parameters of CNTFETs for RF applications. This proposed technique allows to remove random errors in measured S parameters of small-signal device: in this way the intrinsic model of CNTFETs can be implement directly in simulation software.File in questo prodotto:
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