In this paper we present a comparison among I-V models of CNTFETs proposed in literature in order to determine the model more easily implementable in simulation software for electronic circuit design. We have compared the CNTFETs model, already proposed by us, with Deng-Wong’s and Koswatta’s models. In particular our model, already structured to implement in simulator software, has been modified to characterize the I-V characteristics of CNTFETs below threshold. In this way it has been possible to have a more complete comparison, because the examined models consider the behaviour of device in sub-threshold regime.In spite of other models, our model seems to allow an easier implementation in the computer aided design of the most common analogue and digital circuits, showing a good agreement between the experimental and simulated characteristics, with processing times practically instant.
A Comparison of I-V Models for Carbon Nanotube Field Effect Transistors / R., Marani; Perri, Anna Gina. - In: INTERNATIONAL JOURNAL OF ADVANCES IN ENGINEERING AND TECHNOLOGY. - ISSN 2231-1963. - 6:6(2014), pp. 2496-2507.
A Comparison of I-V Models for Carbon Nanotube Field Effect Transistors
PERRI, Anna Gina
2014-01-01
Abstract
In this paper we present a comparison among I-V models of CNTFETs proposed in literature in order to determine the model more easily implementable in simulation software for electronic circuit design. We have compared the CNTFETs model, already proposed by us, with Deng-Wong’s and Koswatta’s models. In particular our model, already structured to implement in simulator software, has been modified to characterize the I-V characteristics of CNTFETs below threshold. In this way it has been possible to have a more complete comparison, because the examined models consider the behaviour of device in sub-threshold regime.In spite of other models, our model seems to allow an easier implementation in the computer aided design of the most common analogue and digital circuits, showing a good agreement between the experimental and simulated characteristics, with processing times practically instant.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.