The research activity presented in this paper deals with accelerated reliability tests on a new electronic device, which is an optocoupler designed and manufactured in Italy for aerospace application. In the paper a complete approach for the experimental evaluation of the device reliability performance is proposed. A reliability test plan was designed and implemented, considering the application of different thermal severities (maximum and minimum temperatures, dwell time and thermal rate). The description of the new device, the test plan and its implementation as well as preliminary results will be presented. © 2014 IEEE.
Accelerated life tests of a new optocoupler for aerospace application / Andria, Gregorio; DI NISIO, Attilio; Scarano, VALERIA L.; Spadavecchia, Maurizio; Bregoli, Matteo; Franceschi, Matteo; Tavernini, Nicola. - (2014), pp. 6865978.510-6865978.514. (Intervento presentato al convegno 2014 IEEE International Workshop on Metrology for Aerospace, MetroAeroSpace 2014 tenutosi a Benevento, Italy nel May 29-30, 2014) [10.1109/MetroAeroSpace.2014.6865978].
Accelerated life tests of a new optocoupler for aerospace application
ANDRIA, Gregorio;DI NISIO, Attilio;SCARANO, VALERIA L.;SPADAVECCHIA, MAURIZIO;
2014-01-01
Abstract
The research activity presented in this paper deals with accelerated reliability tests on a new electronic device, which is an optocoupler designed and manufactured in Italy for aerospace application. In the paper a complete approach for the experimental evaluation of the device reliability performance is proposed. A reliability test plan was designed and implemented, considering the application of different thermal severities (maximum and minimum temperatures, dwell time and thermal rate). The description of the new device, the test plan and its implementation as well as preliminary results will be presented. © 2014 IEEE.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
