An exact definition of the critical area for a short between two rectangular conductors, for different geometries and defect sizes, is presented. Moreover, based upon a formalization of the concept of interconnecting wires in a semiconductor IC, the open failure in a rectangular conductor is also defined. The analysis constitutes the basis for a computer implementation. The approximations for very long conductors are also discussed and compared with the exact results.
Critical areas for finite length conductors / Corsi, F.; Martino, S.; Marzocca, C.; Tangorra, R.; Baroni, C.; Buraschi, M.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 32:11(1992), pp. 1539-1544. [10.1016/0026-2714(92)90453-R]
Critical areas for finite length conductors
Corsi, F.;Marzocca, C.;
1992-01-01
Abstract
An exact definition of the critical area for a short between two rectangular conductors, for different geometries and defect sizes, is presented. Moreover, based upon a formalization of the concept of interconnecting wires in a semiconductor IC, the open failure in a rectangular conductor is also defined. The analysis constitutes the basis for a computer implementation. The approximations for very long conductors are also discussed and compared with the exact results.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
