An exact definition of the critical area for a short between two rectangular conductors, for different geometries and defect sizes, is presented. Moreover, based upon a formalization of the concept of interconnecting wires in a semiconductor IC, the open failure in a rectangular conductor is also defined. The analysis constitutes the basis for a computer implementation. The approximations for very long conductors are also discussed and compared with the exact results.
|Titolo:||Critical areas for finite length conductors|
|Data di pubblicazione:||1992|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1016/0026-2714(92)90453-R|
|Appare nelle tipologie:||1.1 Articolo in rivista|