In the present article, we study the development of a wear profile in an axially symmetric contact under conditions of gross slip and assumption of the Reye-Archard wear criterion. Simulations are carried out using the method of dimensionality reduction and a full finite element method (FEM) formulation. The calculation time of the proposed model is several orders lower than that of FEM-based models and allows for much higher spatial resolution.

Fast High-Resolution Simulation of the Gross Slip Wear of Axially Symmetric Contacts

Menga, N.;PAPANGELO, Antonio;CIAVARELLA, Michele;
2016-01-01

Abstract

In the present article, we study the development of a wear profile in an axially symmetric contact under conditions of gross slip and assumption of the Reye-Archard wear criterion. Simulations are carried out using the method of dimensionality reduction and a full finite element method (FEM) formulation. The calculation time of the proposed model is several orders lower than that of FEM-based models and allows for much higher spatial resolution.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/83611
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