Sfoglia per Autore
DESIGN AND COST EVELUATION OF SIMPLE INTERCONNECTION CIRCUITS FOR MULTIPROCESSOR SYSTEMS
1988-01-01 Corsi, Francesco; Castagnolo, B; Camarda, Pietro; Di Lecce, Vincenzo
A study of GaAs MESFET nonlinear models for circuit simulation
1988-01-01 Corsi, Francesco; Armenise, M; Perri, Anna Gina
Noise characterization of GaAs MESFETs for the design of optical amplifiers
1988-01-01 Corsi, Francesco; Armenise, M. N.; Perri, Anna Gina
SPICE SIMULATION OF LATCH-UP ANOMALOUS EFFECTS OBSERVED BY ELECTRICAL MEASUREMENTS AND IR MICROSCOPY
1988-01-01 Corsi, Francesco; Martino, M; Muschitiello, M; Stucchi, M; Zanoni, E.
Design and Cost Evaluation of Simple Interconnection Circuits for Multiprocessor Systems
1988-01-01 Camarda, P.; Castagnolo, B.; Corsi, F.; Di Lecce, V.
PENELOPE: a graph based logic simulator for MOS circuits
1988-01-01 Castagnolo, B.; Corsi, F.; Martino, S.
CHARACTERIZATION OF ANOMALOUSLATCH-UP EFFECTS BY MEANS OF IR MICROSCOPY AND SPICE SIMULATION
1988-01-01 Corsi, Francesco; Canali, C; Muschitiello, M; Zanoni, E.
INFRARED MICROSCOPY DIRECT OBSERVATION OF CURRENTE REDISTRIBUTION AND SPICE SIMULATION OF LATCH-UP I-V HYSTERESIS EFFECTS
1988-01-01 Corsi, Francesco; Cavioni, T; Martino, M; Muschitiello, M; Stucchi, M; Zanoni, E.
CORRELATION BETWEEN ANOMALOUS LATCH-UP I-V CHARACTERISTICS AND OBSERVATION OF CURRENT DISTRIBUTION BY IR MICROSCOPY IN CMOS IC'S
1988-01-01 Corsi, Francesco; Canali, C; Muschitiello, M; Zanoni, E.
A COMPARISON OF CIRCUIT SIMULATION MODELS OF GAAS MESFETS BY EXPERIMENTAL CHARACTERIZATION
1988-01-01 Corsi, Francesco; Perri, Anna Gina; Armenise, M. N. ANDRESCIANI V.
ANALYTICA TECHNIQUESFOR LOCALIZATION AND SENSITIVITY ANALYSIS OF LATCH-UP IN CMOS IC'S
1988-01-01 Corsi, Francesco; Muschitiello, M; Stucchi, M; Zanoni, E; Canali, C.
Infrared microscopy study of anomalous latchup characteristics due to current redistribution in different parasitic paths
1989-01-01 Canali, C.; Corsi, F.; Muschitiello, M.; Zanoni, E.
CORRELATION BETWEEN LATCH-UP HYSTERESIS AND WINDOW EFFECTS IN COMMERCIAL CMOS IC'S BY MEANS OF IR MICROSCOPY AND SCANNING LASER MICROSCOPY
1989-01-01 Corsi, Francesco; Muschitiello, M; Stucchi, M; Zanoni, E.
Noise characterization of GaAs MESFETs for the design of optical amplifiers
1990-01-01 Perri, Anna G.; Armenise, Mario N.; Corsi, Francesco
VLSI reliability: Contributions from a three year national research program
1990-01-01 Soncini, Giovanni; Canali, Claudio; Zanoni, E.; Corsi, Francesco; Diligenti, Alessandro; Fantini, Fausto; Monaco, Vito A.; Masetti, Guido; Morandi, Carlo
Physical Defects vs Circuit Faults in a CMOS Programmable Logic Device
1990-01-01 Corsi, Francesco; Martino, S; DE VENUTO, Daniela
TEST GENERATION FOR PAL DEVICES
1991-01-01 Corsi, Francesco; Martino, S; SANGIOVANNI VINCENTELLY, A.
THE USE OF A SWITCHABLE MEMORY TO ENHANCE THE PERFORMANCE OF A STRENGHTENED NODE
1991-01-01 Aloisio, G; Bobhicchio, M; Corsi, Francesco; DELLO RUSSO, P.
IMPLEMENTING FINITE STATE MACHINES BY PROGRAMMABLE LOGIC DEVICES
1991-01-01 Corsi, Francesco; Fucci, R; Martino, S.
ACCURATE EVALUATION OF CRITICAL AREAS FOR SHORTS BETWEEN FINITE LENGHT CONDUCTORS
1991-01-01 Baroni, C; Bochicchio, M; Buraschi, M; Corsi, Francesco; Martino, S; Marzocca, C; Tangorra, R; Zampetti, P.
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